Part Details | DIGITAL MICROCIRCUIT
5962-00-209-5224 A microcircuit specifically designed to generate, modify, or process electrical signals which operate with two distinct or binary states. These states are commonly referred to as on and off, true and false, high and low, or "1" and "0".
Alternate Parts: MC5410L, M3851000103BCB, M38510/00103BCB, 88554000262, 8855400026-2, SN5410J00, SN5410J-00, 5962-00-209-5224, 00-209-5224, 5962002095224, 002095224
Supply Group (FSG) | NSN Assigned | NIIN | Item Name Code (INC) |
---|---|---|---|
59 | APR 18, 1973 | 00-209-5224 | 31779 ( MICROCIRCUIT, DIGITAL ) |
REFERENCE DRAWINGS & PICTURES
Cross Reference | NSN 5962-00-209-5224
Part Number | Cage Code | Manufacturer |
---|---|---|
MC5410L | 04713 | FREESCALE SEMICONDUCTOR, INC. |
M38510/00103BCB | 81349 | MILITARY SPECIFICATIONSPROMULGATED BY MILITARY |
8855400026-2 | 57057 | NAVCOM DEFENSE ELECTRONICS, INC. |
SN5410J-00 | 01295 | TEXAS INSTRUMENTS INCORPORATEDDBA TEXAS INSTRUMENTS |
Technical Data | NSN 5962-00-209-5224
Characteristic | Specifications |
---|---|
OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
DESIGN FUNCTION AND QUANTITY | 3 GATE, NAND |
INPUT CIRCUIT PATTERN | TRIPLE 3 INPUT |
VOLTAGE RATING AND TYPE PER CHARACTERISTIC | ACVM0.5 VOLTS MAXIMUM AND ACV7.0 VOLTS MAXIMUM |
TIME RATING PER CHACTERISTIC | AEE27.00 NANOSECONDS MAXIMUM AND AED24.00 NANOSECONDS MAXIMUM |
OPERATING TEMP RANGE | -55.0 TO +125.0 DEG CELSIUS |
TERMINAL TYPE AND QUANTITY | 14 PRINTED CIRCUIT |
TERMINAL SURFACE TREATMENT | SOLDER |
INCLOSURE CONFIGURATION | DUAL-IN-LINE |
INCLOSURE MATERIAL | CERAMIC AND METAL |
CASE OUTLINE SOURCE AND DESIGNATOR | D-1 MIL-M-38510 |
BODY LENGTH | 0.785 INCHES MAXIMUM |
BODY HEIGHT | 0.140 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
BODY WIDTH | 0.220 INCHES MINIMUM AND 0.310 INCHES MAXIMUM |
MAXIMUM POWER DISSIPATION RATING | 40.0 MILLIWATTS |
STORAGE TEMP RANGE | -65.0 TO +150.0 DEG CELSIUS |
FEATURES PROVIDED | MONOLITHIC |
TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |